共找到 150 條與 掃描電子顯微鏡法 相關(guān)的標(biāo)準(zhǔn)，共 10 頁
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
この規(guī)格は，認(rèn)証標(biāo)準(zhǔn)物質(zhì)(以下，CRMという。)又は標(biāo)準(zhǔn)物質(zhì)(以下，RMという。)を用いて走査電子顕微鏡(以下，SEMという。)の像倍率の校正方法について規(guī)定する。ただし，この規(guī)格は測長SEMには適用しない。たお，この規(guī)格の校正の倍率節(jié)囲は，用いるCRM又はRMによって制約を受ける
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
What is ISO 21466 - CDSEM about ? ISO 21466 specifies the structure model with related parameters, file format, and fitting procedure
Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
本文件描述了微量物證鑒定中應(yīng)用掃描電子顯微鏡/射線能譜法檢驗(yàn)?zāi)嗤恋姆椒? 包括原理、儀器和材料、檢驗(yàn)步驟以及檢驗(yàn)結(jié)果。 本文件適用于微量物證鑒定中應(yīng)用掃描電子顯微鏡/射線能譜法對(duì)泥土元素成分的檢驗(yàn)和比對(duì)
Soil inspection scanning electron microscope/X-ray energy spectrometry
Metallic coatings - Measurements of coating thickness - Scanning electron microscope method
Cross References: ISO 16700:2004 ISO 17025:1999 ISO/FDIS 22493
BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
This document specifies the structure model with related parameters, file format and fitting procedure for characterizing critical dimension (CD
Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination
Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
Determination of asbestos in technical products - Scanning electron microscopy method
4.1 Proper use of this practice can yield calibrated magnifications with precision of 58201
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
