共找到 150 條與 掃描電子顯微鏡法 相關(guān)的標(biāo)準(zhǔn)，共 10 頁
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
Determination of asbestos in technical products — scanning electron microscopic method
Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections
Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
本文件規(guī)定了法庭科學(xué)領(lǐng)域掃描電子顯微鏡/X射線能譜儀檢驗(yàn)金屬物證元素成分的方法。本文件適用于法庭科學(xué)領(lǐng)域金屬物證的元素成分分析及比對(duì)檢驗(yàn)，其他領(lǐng)域亦可參照使用
Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
本文件規(guī)定了法庭科學(xué)領(lǐng)域掃描電子顯微鏡/X 射線能譜法檢驗(yàn)橡膠元素成分的方法。 本文件適用于法庭科學(xué)領(lǐng)域橡膠物證元素成分分析和比對(duì)檢驗(yàn)，其他領(lǐng)域亦可參照使用
Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
本標(biāo)準(zhǔn)規(guī)定了法庭科學(xué)領(lǐng)域掃描電子顯微鏡/能譜法檢驗(yàn)射擊殘留物的提取、包裝及要求。 本標(biāo)準(zhǔn)適用于法庭科學(xué)領(lǐng)域中掃描電子顯微鏡/能譜法檢驗(yàn)射擊殘留物的提取、包裝，其他領(lǐng)域亦可參照使用
Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
本標(biāo)準(zhǔn)規(guī)定了掃描電鏡的檢驗(yàn)方法。 本部分適用于刑事技術(shù)領(lǐng)域中微量物證的理化檢驗(yàn)，其他領(lǐng)域亦可參照使用
Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron
Metallic coatings; measurement of coating thickness; scanning electron microscope method
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
本文件規(guī)定了利用掃描電子顯微鏡法測(cè)量石墨烯材料片徑尺寸的術(shù)語和定義、原理、儀器設(shè)備、試劑和材料、結(jié)果分析和測(cè)試報(bào)告內(nèi)容。 本文件適用于石墨烯材料片徑尺寸的測(cè)量
Graphene material sheet size measurement using scanning electron microscopy
1???Scope This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
