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secondary ion chromatography

secondary ion chromatography, Total:94 items.

In the international standard classification, secondary ion chromatography involves: Analytical chemistry, Products of the chemical industry, Optics and optical measurements, Testing of metals, Electricity. Magnetism. Electrical and magnetic measurements, Semiconducting materials, Water quality, Vocabularies, Galvanic cells and batteries, Electromechanical components for electronic and telecommunications equipment, General methods of tests and analysis for food products, Environmental protection, Geology. Meteorology. Hydrology, Fuels, Printed circuits and boards.

Professional Standard - Agriculture, secondary ion chromatography

• 790獸藥典 一部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
• 783獸藥典 二部-2015 Appendix Contents 0500 Chromatography 0513 Ion Chromatography
• 203藥典 三部-2020 Chromatography 0513 Ion Chromatography
• 64藥典 四部-2020 0513 Ion chromatography
• 83藥典 四部-2015 0513 Ion chromatography
• 184藥典 三部-2015 Chromatography 0513 General Principles of Ion Chromatography 25
• 161藥典 三部-2010 Appendix III Chromatography IIIE Ion Chromatography
• 791獸藥典 一部-2015 Appendix Contents 0500 Chromatography 0514 Size Exclusion Chromatography
• JJG(教委) 020-1996 Verification Regulations for Ion Chromatography
• 2311藥典 二部-2010 Appendix V J Ion Chromatography
• 1769藥典 一部-2010 Appendix VI G Ion Chromatography

國(guó)家市場(chǎng)監(jiān)督管理總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), secondary ion chromatography

• GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• GB/T 36240-2018 Ion chromatographs
• GB/T 39144-2020 Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry
• GB/T 40109-2021 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon
• GB/T 37385-2019 Test method for chloride content of silicon—Ion chromatography method

International Organization for Standardization (ISO), secondary ion chromatography

• ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
• ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
• ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS

British Standards Institution (BSI), secondary ion chromatography

• BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
• BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
• BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
• BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

GSO, secondary ion chromatography

• OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
• GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
• BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
• OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
• GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
• OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
• BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
• GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
• BH GSO ISO 18114:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
• BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

Japanese Industrial Standards Committee (JISC), secondary ion chromatography

• JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
• JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
• JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
• JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
• JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
• JIS K 0127:2001 General rules for ion chromatographic analysis
• JIS K 0127:1992 General rules for ion chromatographic analysis
• JIS K 0127:2013 General rules for ion chromatography

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, secondary ion chromatography

• GB/T 43663-2024 Surface chemical analysis Secondary ion mass spectrometry Repeatability and consistency of relative intensity scale for static secondary ion mass spectrometry
• GB/T 42263-2022 Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
• GB/T 25186-2010 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of relative sensitivity factors from ion-implanted reference materials
• GB/T 14571.5-2016 Test Methods for Ethylene Glycols for Industrial Use Part 5: Determination of Chloride Ion Chromatography
• GB/T 32495-2016 Surface chemical analysis.Secondary-ion mass spectrometry.Method for depth profiling of arsenic in silicon
• GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry

SCC, secondary ion chromatography

• 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
• 07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Group Standards of the People's Republic of China, secondary ion chromatography

• T/HNNMIA 8-2023 Chemical analysis methods for secondary aluminium ash - Determination of total fluorine content - Ion chromatography
• T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry
• T/JSWA 006-2023 Determination of sodium hypochlorite bromate and chlorate by ion chromatography
• T/NAIA 035-2021 Determination of Sulfur Dioxide Content in Wolfberry by Ion Chromatography

Association Francaise de Normalisation, secondary ion chromatography

• NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
• NF ISO 11632:1998 Emission from stationary sources - Determination of the mass concentration of sulfur dioxide - Ion chromatography method

Professional Standard - Electron, secondary ion chromatography

• SJ/T 11493-2015 Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
• SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry

American Society for Testing and Materials (ASTM), secondary ion chromatography

• ASTM E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1162-87(1996) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy
• ASTM E1635-06(2019) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1635-95(2000) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

Professional Standard - Commodity Inspection, secondary ion chromatography

• SN/T 4244-2015 Determination of chloride in ethylene glycol,diethylene glycol and triethylene glycol.Ion chromatography
• SN/T 4250-2015 Determination of sulfer dioxide in bamboo and wood products.Ion chromatography method
• SN/T 5032-2017 Determination of chloride ions in petroleum products. Ion chromatography

Korean Agency for Technology and Standards (KATS), secondary ion chromatography

• KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
• KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
• KS M 0035-1993 General rules for ion chromatographic analysis
• KS D ISO 18114-2020 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
• KS D ISO 18114-2005(2020) Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials

US-ACEI, secondary ion chromatography

• IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method

IPC - Association Connecting Electronics Industries, secondary ion chromatography

• IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
• IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
• IPC WP-008 CD-2005 Setting Up Ion Chromatography Capability

Shandong Provincial Standard of the People's Republic of China, secondary ion chromatography

• DB37/T 2393-2013 Secondary lithium ion battery electrolyte

Institute of Interconnecting and Packaging Electronic Circuits (IPC), secondary ion chromatography

• IPC WP-008-2005 Setting Up Ion Chromatography Capability
• IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A

國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局, secondary ion chromatography

• SN/T 4585-2016 Determination of methylarsonic acid and dimethylarsinic acid residues in exported foods by liquid chromatography-inductively coupled plasma mass spectrometry

KR-KS, secondary ion chromatography

• KS M 0035-2008(2023) General rules for ion chromatographic analysis

Anhui Provincial Standard of the People's Republic of China, secondary ion chromatography

• DB34/T 1108-2009 Determination of sodium formaldehyde sulfoxylate (hanging white block) in rice noodles by ion chromatography

National Metrological Verification Regulations of the People's Republic of China, secondary ion chromatography

• JJG(地質(zhì)) 1008-1990 Verification Regulations for Ion Chromatography
• JJG 823-1993 Verification Regulation for Ion Chromatograph
• JJG 823-2014 Verification Regulation for Ion Chromatograph

Professional Standard - Environmental Protection, secondary ion chromatography

• HJ/T 84-2001 Water quality.Determination of inorganic anions.Ion chromatography method

Professional Standard - Water Conservancy, secondary ion chromatography

• SL 86-1994 Determination of inorganic anions in water (Ion chromatography method)

中華人民共和國(guó)國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), secondary ion chromatography

• GB/T 35664-2017 Determination of ammonium in the wet precipitation—Ion chromatography

Henan Provincial Standard of the People's Republic of China, secondary ion chromatography

• DB41/T 778-2013 Determination of Chloride Ion Content in Chemical Fertilizers by Ion Chromatography

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