DIN 50451-6:2014
半導體工藝用材料測試. 液體中痕量元素測定. 第6部分: 測定含有氫氟酸的高純度氟化銨溶液蝕刻混合物和高純度氟化銨溶液 (NH4F) 中的36種元素
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH4F) and in etching mixtures of high-purity ammonium fluoride solution